Description
Durable Materials Designed for RF Testing
Device Under Test Shelves are constructed from Delrin or similar non-reflective materials. These materials protect devices from scratches and reduce unwanted RF reflections inside the enclosure. As a result, measurements remain consistent and free from interference caused by reflective surfaces.
In addition, the non-conductive design supports use in RF-sensitive environments where metal components could affect performance.
Slotted Design for Airflow and Cable Management
The slotted shelf design improves airflow around the DUT, helping manage heat during extended test runs. Proper airflow supports stable device operation and reduces the risk of thermal issues.
The slots also allow for clean and flexible cable routing. Engineers can route power, data, and RF cables without pinching or bending, keeping test setups organized and easy to access.
Adjustable Grid Layout for Flexible DUT Placement
Each shelf features a grid layout that allows flexible DUT positioning. Engineers can adjust placement to support different device sizes, test orientations, and fixture requirements.
This grid-based design also supports expandable configurations. Device Under Test Shelves can accommodate single-device testing, multi-device setups, and future test expansion without replacing the enclosure.
Slide-Out and Removable Shelf Design
The shelf track supports a three-quarter pull-out motion with a built-in stop. This feature allows easy loading and unloading while preventing accidental full removal.
For added convenience, each shelf is fully removable. Engineers can mount and configure DUTs outside the enclosure, then slide the shelf back into place. This reduces setup time and improves overall safety.
Common Applications for Device Under Test Shelves
Device Under Test Shelves are commonly used in:
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RF shield boxes
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Shielded production enclosures
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Wireless validation labs
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R&D test environments
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Automated and manual test systems







